The Ångstrom may be the most remarkable frontier of our time.
The Semiconductor chip industry is rapidly innovating Advanced Packaging and 3D Nano Devices driven by emergent AI needs and led by pioneers like TSMC, Samsung, Intel, SK Hynix and Micron.
Seeing below the surface is critical and Metrology is catching up.
Seeing below the surface is critical and Metrology is catching up.
When light cannot penetrate, sound creates immense possibility. Physics restricts expected outcomes in Semiconductor metrology by way of the diffraction limit. However, our ingenuity (and Physics) also gives us a solution.
Makr is re:imagining Acoustic Atomic Force Microscopy to probe the depths of Silicon at the atomic scale.
Makr is re:imagining Acoustic Atomic Force Microscopy to probe the depths of Silicon at the atomic scale.
Think of this as ultrasound for the Angstrom age.
Subsurface Dimension with Hi-res, Stereo Imaging.
AI Classification, Segmentation and Reconstruction Analytics.
Hi-throughput and in-line.
Voids, process induced & particular defects.
At the heart of our science is a
Self-sensing, Self-actuating probe operating at an optimally engineered resonance.
Self-sensing, Self-actuating probe operating at an optimally engineered resonance.
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Shifting from 2D to 3D metrology is a measure of our time. Makr enables the silicon engineer to visualise what has largely remained unseen.
Dr. Abhay Pasupathy
Science Advisor
A guiding light for research at MAKR, Abhay is a leading expert on Condensed Matter Physics. He is a Professor at Columbia University, a Group Leader at Brookhaven National Labs and specializes in the study of emergent quantum phenomena in novel materials.
Dr. Abhay Pasupathy
Science Advisor
A guiding light for research at MAKR, Abhay is a leading expert on Condensed Matter Physics. He is a Professor at Columbia University, a Group Leader at Brookhaven National Labs and specializes in the study of emergent quantum phenomena in novel materials.